000 01055cam a2200325 a 4500
999 _c69453
_d69453
001 1610280
003 FUTML
005 20180709110623.0
008 970413s1996 si a b 000 0 eng d
020 _a9810223005
035 _a(OCoLC)36729771
037 _aB-25689
040 _aLCC
_cLCC
_dFUTML
_bENG
049 _aFUTML
050 _aQC451
_bC83
090 _bD43 1996
100 1 _aDe Crescenzi, M.
_q(Maurizio)
_930443
245 1 0 _aElectron scattering and related spectroscopies /
_cM. De Crescenzi, M.N. Piancastelli.
264 1 _aSingapore ;
_aRiver Edge, NJ :
_bWorld Scientific,
_c[1996]
264 4 _c�1996
300 _axiii, 412 pages :
_billustrations ;
_c23 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
504 _aIncludes bibliographical references.
590 _aB-25689/ALIYU/20180709
650 0 _aElectron spectroscopy.
_99002
650 0 _aElectrons
_xScattering.
_930444
650 0 _aPhotoelectron spectroscopy.
_930445
650 0 _aAuger effect.
_930446
650 0 _aElectron energy loss spectroscopy.
_930447
700 1 _aPiancastelli, M. N.
_q(M. Novella)
_930448
912 _aALIYU
_bALIYU
_cSABA
942 _2lcc
_cBKS
949 _aAWWWAL IBRAHIM LIBRARY BOSSO
_cQC451.
_dC83
_g23421340006
_nNC1