| 000 | 01083nam a2200289 a 4500 | ||
|---|---|---|---|
| 999 |
_c65733 _d65733 |
||
| 001 | 4351039 | ||
| 003 | FUTML | ||
| 005 | 20170606140404.0 | ||
| 008 | 890601s1989 maua b 001 0 eng | ||
| 010 | _a 89147603 | ||
| 020 | _a0120145820 | ||
| 037 | _aB-7968 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aQH212.A76 _bS25 1989 |
| 082 | 0 | 0 |
_a502/.8/2 _220 |
| 100 | 1 |
_aSakurai, Toshio. _923268 |
|
| 245 | 1 | 0 |
_aAtom-probe field ion microscopy and its applications / _cToshio Sakurai, A. Sakai, H.W. Pickering. |
| 260 |
_aBoston : _bAcademic Press, _cc1989. |
||
| 300 |
_avii, 299 p. : _bill. ; _c24 cm. |
||
| 440 | 0 |
_aAdvances in electronics and electron physics. _pSupplement ; _v20 _923269 |
|
| 504 | _aIncludes bibliographical references (p. 275-292) and indexes. | ||
| 590 | _aB-7968/ID/06/06/17 | ||
| 650 | 0 |
_aAtom-probe field ion microscopy. _923270 |
|
| 700 | 1 |
_aSakai, A. _923271 |
|
| 700 | 1 |
_aPickering, H. W. _923272 |
|
| 906 |
_a7 _bcbc _corignew _d3 _encip _f19 _gy-gencatlg |
||
| 912 |
_aID _bID _cID |
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| 942 |
_2lcc _cBKS |
||
| 949 |
_aBOSSO _cQH212.A76S25 1989 _d.A76S25 1989 _nNC 1 |
||