000 01109nam a2200289 a 4500
999 _c59682
_d59682
001 2093727
003 FUTML
005 20170418114018.0
008 941118s1994 si a b 001 0 eng d
010 _a 95131769
020 _a9810218834
035 _a(OCoLC)31482337
037 _aB-25640
040 _aFUTML
_cFUTML
_dIU
_dDLC
_bENG.
042 _alccopycat
050 0 4 _aTK7891.85
_b.K55 1994
100 1 _aKikoin, K. A.
_910951
245 1 0 _aTransition metal impurities in semiconductors :
_belectronic structure and physical properties /
_cK.A. Kikoin, V.N. Fleurov.
260 _aSingapore ;
_aRiver Edge, N.J. :
_bWorld Scientific,
_cc1994.
300 _ax, 349 p. :
_bill. ;
_c22 cm.
504 _aIncludes bibliographical references (p. 327-336) and index.
590 _aB-25640/LAWAL/180417
650 0 _aSemiconductors
_xDefects.
_910952
650 0 _aTransition metals.
_910953
700 1 _aFl�erov, V. N.
_q(Viktor Nikolaevich)
_910954
906 _a7
_bcbc
_ccopycat
_d2
_encip
_f19
_gy-gencatlg
912 _aLAWAL
_bLAWAL
_cLAWAL
942 _2lcc
_cBKS
949 _aIBB LIBRARY, GK
_cTK7891.85.K55 1994
_d.K55 1994
_g2342107534
_nnc 1