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|---|---|---|---|
| 999 |
_c58891 _d58891 |
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| 001 | 4833398 | ||
| 003 | FUTML | ||
| 005 | 20170412105739.0 | ||
| 008 | 900228m19901992enka b 001 0 eng | ||
| 010 | _a 90012172 | ||
| 020 |
_a0471920819 (v. 1) : _c$120.00 |
||
| 020 | _a0471920827 (v. 2) | ||
| 037 | _a15691 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aTP156.S95 _bP73 1990 |
| 082 | 0 | 0 |
_a660/.293 _220 |
| 245 | 0 | 0 |
_aPractical surface analysis / _cedited by D. Briggs and M.P. Seah. |
| 250 | _a2nd ed. | ||
| 260 |
_aChichester ; _aNew York : _bWiley ; _aAarau : _bSalle + Sauerl�ander, _cc1990-c1992. |
||
| 300 |
_a2 v. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and indexes. | ||
| 505 | 1 | _av. 1. Auger and X-ray photoelectron spectroscopy -- v. 2. Ion and neutral spectroscopy. | |
| 590 | _aB-15691/ID/12/04/17 | ||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. _99001 |
|
| 650 | 0 |
_aElectron spectroscopy. _99002 |
|
| 700 | 1 |
_aBriggs, D. _q(David), _d1948- _99003 |
|
| 700 | 1 |
_aSeah, M. P. _99004 |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 912 |
_aID _bID _cID |
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| 942 |
_2lcc _cBKS |
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| 949 |
_aGK _cTP156.S95 _dP73 1990 _nnc 1 |
||