000 01221pam a2200277 a 4500
999 _c56215
_d56215
001 3888197
003 FUTML
005 20170314104619.0
008 901105s1991 nyua b 001 0 eng
010 _a 90023730
020 _a0471929778 :
_c$120.00 (est.)
037 _aB-16270
040 _aDLC
_cDLC
_dDLC
041 1 _aeng
_hfre
050 0 0 _aTA417.23
_b.E24 1991
082 0 0 _a620.1/1299
_220
100 1 _aEberhart, J. P.
_q(Jean Pierre)
_92328
240 1 0 _aAnalyse structurale et chimique des mat�eriaux.
_lEnglish
245 1 0 _aStructural and chemical analysis of materials :
_bX-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy /
_cJ.P. Eberhart ; translated by J.P. Eberhart.
260 _aChichester, West Sussex, England ;
_aNew York :
_bWiley,
_cc1991.
300 _axxx, 545 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references (p. [533]-538) and index.
590 _aB-16270/abu/14/03/17
650 0 _aMaterials
_xMicroscopy.
_92329
650 0 _aMicrostructure.
_92330
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
912 _aAbu
_bAbu
_cAbu
942 _2lcc
_cBKS
949 _aGidan Kwano Library
_cTA417.23
_d.E24 1991
_nnc 1