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Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering.

By: Sakurai, Toshio.
Contributor(s): Sakai, A | Pickering, H. W.
Material type: materialTypeLabelBookSeries: Advances in electronics and electron physics. 20Supplement. Publisher: Boston : Academic Press, c1989Description: vii, 299 p. : ill. ; 24 cm.ISBN: 0120145820.Subject(s): Atom-probe field ion microscopyDDC classification: 502/.8/2
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Includes bibliographical references (p. 275-292) and indexes.

B-7968/ID/06/06/17

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