Sakurai, Toshio. <br/><br/>
Atom-probe field ion microscopy and its applications / 
Toshio Sakurai, A. Sakai, H.W. Pickering. 
 - Boston :  Academic Press,  c1989. 
 - vii, 299 p. :  ill. ;  24 cm. 
 - Advances in electronics and electron physics.  Supplement ;  20 .
<br/><br/>Includes bibliographical references (p. 275-292) and indexes. 
<br/><br/><label>ISBN: </label>0120145820 
<br/><br/><label>Source: </label>B-7968 
<br/><br/><label>LCCN: </label>89147603  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atom-probe field ion microscopy.
<br/><br/><label>LC Class. No.: </label>QH212.A76  / S25 1989 
<br/><br/><label>Dewey Class. No.: </label>502/.8/2