Jakubowski, Andrzej. <br/><br/>
Diagnostic measurements in LSI/VLSI integrated circuits production / 
Andrzej Jakubowski, Wies�aw Marciniak, Henryk M. Przew�ocki. 
 - Singapore ;  Teaneck, NJ :  World Scientific,  c1991. 
 - xv, 356 p. :  ill. ;  23 cm. 
 - Advanced series in electrical and computer engineering ;  vol. 7 .
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>9810202822 
<br/><br/><label>Source: </label>B-23986 
<br/><br/><label>LCCN: </label>91003700  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Design and construction.<br/>Integrated circuits--Very large scale integration--Testing.
<br/><br/><label>LC Class. No.: </label>TK7874  / .J34 1991 
<br/><br/><label>Dewey Class. No.: </label>621.39/5