Eberhart, J. P.

Structural and chemical analysis of materials : X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart. - Chichester, West Sussex, England ; New York : Wiley, c1991. - xxx, 545 p. : ill. ; 26 cm.

Includes bibliographical references (p. [533]-538) and index.

0471929778 : $120.00 (est.)

B-16270

90023730


Materials--Microscopy.
Microstructure.

TA417.23 / .E24 1991

620.1/1299