Structural and chemical analysis of materials : X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy /
J.P. Eberhart ; translated by J.P. Eberhart.
- Chichester, West Sussex, England ; New York : Wiley, c1991.
- xxx, 545 p. : ill. ; 26 cm.
Includes bibliographical references (p. [533]-538) and index.