Diagnostic measurements in LSI/VLSI integrated circuits production / Andrzej Jakubowski, Wies�aw Marciniak, Henryk M. Przew�ocki.
By: Jakubowski, Andrzej
.
Contributor(s): Andrzej Jakubowski | Marciniak, Wies�aw | Przew�ocki, Henryk M.
Material type: 
BookSeries: Advanced series in electrical and computer engineering ; vol. 7. Publisher: Singapore ; Teaneck, NJ : World Scientific, c1991Description: xv, 356 p. : ill. ; 23 cm.ISBN: 9810202822.Subject(s): Integrated circuits -- Very large scale integration -- Design and construction | Integrated circuits -- Very large scale integration -- TestingDDC classification: 621.39/5
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Books,Booklets,Workbooks
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IBB Library-Gidan Kwano | TK7874.J34 1991 (Browse shelf) | nc 1 | Available | 2342106023 |
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| TK7874. H91 1995 Hybrid microelectronics handbook / | TK7874. H91 1995 Hybrid microelectronics handbook / | TK 7874. J33 1988 Introduction to microelectronic fabrication / | TK7874.J34 1991 Diagnostic measurements in LSI/VLSI integrated circuits production / | TK7874.M37 2000 Newnes passive and discrete circuits / | TK7874.M47 1982 Microelectronics and society : | TK7874.M52 Microelectronics, Electromagnetics and Telecommunications : |
Includes bibliographical references.
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