Structural and chemical analysis of materials : X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart.
By: Eberhart, J. P. (Jean Pierre)
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Material type: 
BookPublisher: Chichester, West Sussex, England ; New York : Wiley, c1991Description: xxx, 545 p. : ill. ; 26 cm.ISBN: 0471929778 :.Uniform titles: Analyse structurale et chimique des mat�eriaux. English Subject(s): Materials -- Microscopy | MicrostructureDDC classification: 620.1/1299
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Books,Booklets,Workbooks
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IBB Library-Gidan Kwano | TA417.23.E24 1991 (Browse shelf) | nc 1 | Available | 2342102551 |
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| TA417.2.B64 1992 Nondestructive testing techniques / | TA417.2.H45 2001 Handbook of nondestructive evaluation / | TA417.2.H45 2001 Handbook of nondestructive evaluation / | TA417.23.E24 1991 Structural and chemical analysis of materials : | TA417.25.M43 1992 Measurement of residual and applied stress using neutron diffraction/ | TA417.25.M43 1992 Measurement of residual and applied stress using neutron diffraction/ | TA417.25.M43 1992 Measurement of residual and applied stress using neutron diffraction/ |
Includes bibliographical references (p. [533]-538) and index.
B-16270/abu/14/03/17
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