Atom-probe field ion microscopy and its applications / (Record no. 65733)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01083nam a2200289 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | 4351039 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | FUTML |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20170606140404.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 890601s1989 maua b 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| LC control number | 89147603 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0120145820 |
| 037 ## - ACCESSION NUMBER | |
| Accession NUmber | B-7968 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | DLC |
| Transcribing agency | DLC |
| Modifying agency | DLC |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | QH212.A76 |
| Item number | S25 1989 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502/.8/2 |
| Edition number | 20 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Sakurai, Toshio. |
| 9 (RLIN) | 23268 |
| 245 10 - TITLE STATEMENT | |
| Title | Atom-probe field ion microscopy and its applications / |
| Statement of responsibility, etc. | Toshio Sakurai, A. Sakai, H.W. Pickering. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Boston : |
| Name of publisher, distributor, etc. | Academic Press, |
| Date of publication, distribution, etc. | c1989. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | vii, 299 p. : |
| Other physical details | ill. ; |
| Dimensions | 24 cm. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Advances in electronics and electron physics. |
| Name of part/section of a work | Supplement ; |
| Volume/sequential designation | 20 |
| 9 (RLIN) | 23269 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references (p. 275-292) and indexes. |
| 590 ## - LOCAL NOTE (RLIN) | |
| Accession/Initials/Date of Entry | B-7968/ID/06/06/17 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Atom-probe field ion microscopy. |
| 9 (RLIN) | 23270 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Sakai, A. |
| 9 (RLIN) | 23271 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Pickering, H. W. |
| 9 (RLIN) | 23272 |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | 7 |
| b | cbc |
| c | orignew |
| d | 3 |
| e | ncip |
| f | 19 |
| g | y-gencatlg |
| 912 ## - Cataloguer Details | |
| Cataloguer Details | ID |
| Keyed by | ID |
| Verified By | ID |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | |
| Koha item type | Books,Booklets,Workbooks |
| 949 ## - Local Processing Information | |
| Book Location | BOSSO |
| Cutter Number | .A76S25 1989 |
| Copy Number | NC 1 |
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