Sakurai, Toshio.
Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering. - Boston : Academic Press, c1989. - vii, 299 p. : ill. ; 24 cm. - Advances in electronics and electron physics. Supplement ; 20 .
Includes bibliographical references (p. 275-292) and indexes.
0120145820
B-7968
89147603
Atom-probe field ion microscopy.
QH212.A76 / S25 1989
502/.8/2
Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering. - Boston : Academic Press, c1989. - vii, 299 p. : ill. ; 24 cm. - Advances in electronics and electron physics. Supplement ; 20 .
Includes bibliographical references (p. 275-292) and indexes.
0120145820
B-7968
89147603
Atom-probe field ion microscopy.
QH212.A76 / S25 1989
502/.8/2